FASTER EEG artefact rejection

Source: R/ar-faster.R, R/deprecated.R

An implementation of the FASTER artefact rejection method for EEG by Nolan, Whelan & Reilly (2010) FASTER: Fully Automated Statistical Thresholding for EEG artifact Rejection. J Neurosci Methods.

ar_FASTER(data, ...)

# S3 method for eeg_epochs
ar_FASTER(
  data,
  exclude = NULL,
  test_chans = TRUE,
  test_epochs = TRUE,
  test_cine = TRUE,
  ...
)

# S3 method for eeg_group
ar_FASTER(
  data,
  exclude = NULL,
  test_chans = TRUE,
  test_epochs = TRUE,
  test_cine = TRUE,
  EOG = NULL,
  ...
)

eeg_FASTER(data, ...)

Arguments

data

An object of class eeg_epochs

...

Parameters passed to FASTER

exclude

Channels to be ignored by FASTER.

test_chans

Logical. Run tests of global channel statistics

test_epochs

Logical. Run tests of globally bad epochs.

test_cine

Logical. Run tests for locally bad channels within epochs.

EOG

names of EOG channels to be used when computed maximum EOG values.

Value

An eeg_epochs object with artefact correction applied.

Methods (by class)

  • eeg_epochs: Run FASTER on eeg_epochs

  • eeg_group: Run FASTER on eeg_group objects

References

Nolan, Whelan & Reilly (2010). FASTER: Fully Automated Statistical Thresholding for EEG artifact Rejection. J Neurosci Methods.

Author

Matt Craddock matt@mattcraddock.com

Examples

ar_FASTER(demo_epochs)
#> Globally bad channels: 
#> Globally bad epochs: 26 65
#> Epoched EEG data
#> 
#> Number of channels	: 11 
#> Number of epochs	: 78 
#> Epoch limits		: -0.197 - 0.451 seconds
#> Electrode names		: A5 A13 A21 A29 A31 B5 B6 B8 B16 B18 B26 
#> Sampling rate		: 128  Hz
#> Reference		: average