An implementation of the FASTER artefact rejection method for EEG by Nolan, Whelan & Reilly (2010) FASTER: Fully Automated Statistical Thresholding for EEG artifact Rejection. J Neurosci Methods.
Usage
ar_FASTER(data, ...)
# S3 method for class 'eeg_epochs'
ar_FASTER(
data,
exclude = NULL,
test_chans = TRUE,
test_epochs = TRUE,
test_cine = TRUE,
...
)
# S3 method for class 'eeg_group'
ar_FASTER(
data,
exclude = NULL,
test_chans = TRUE,
test_epochs = TRUE,
test_cine = TRUE,
EOG = NULL,
...
)
eeg_FASTER(data, ...)
Arguments
- data
An object of class
eeg_epochs
- ...
Parameters passed to FASTER
- exclude
Channels to be ignored by FASTER.
- test_chans
Logical. Run tests of global channel statistics
- test_epochs
Logical. Run tests of globally bad epochs.
- test_cine
Logical. Run tests for locally bad channels within epochs.
- EOG
names of EOG channels to be used when computed maximum EOG values.
Methods (by class)
ar_FASTER(eeg_epochs)
: Run FASTER oneeg_epochs
ar_FASTER(eeg_group)
: Run FASTER oneeg_group
objects
References
Nolan, Whelan & Reilly (2010). FASTER: Fully Automated Statistical Thresholding for EEG artifact Rejection. J Neurosci Methods.
Author
Matt Craddock matt@mattcraddock.com
Examples
ar_FASTER(demo_epochs)
#> Globally bad channels:
#> Globally bad epochs: 1 26 65
#> Epoched EEG data
#>
#> Number of channels : 11
#> Number of epochs : 77
#> Epoch limits : -0.197 - 0.451 seconds
#> Electrode names : A5 A13 A21 A29 A31 B5 B6 B8 B16 B18 B26
#> Sampling rate : 128 Hz
#> Reference : average